Serdes bist. Multiple data paths in a finite impulse response (FIR) filter of transmitte...
Serdes bist. Multiple data paths in a finite impulse response (FIR) filter of transmitter of the SerDes or a Jan 17, 2007 · What will be interesting is to see how semiconductor companies choose to mix and match BIST and instrumentation approaches to their Serdes test operations at device-characterization and production-test stages. Intellitech refers to these „helper circuits‟ as “Silicon InstrumentsTM” and they form the basis of JAFTM – JTAG Assisted Functional Test, a partitioned approach to IC/board/system test. The validation features of the tool allows you to exercise the SerDes built-in test capabilities (for example, BIST, Jitter scope We designed and tested an on-chip BIST test for high speed SerDes devices. 1 Introduction The SerDes tool allows you to configure the SerDes block and provides you a GUI application to validate the configuration. Two major types are memory BIST and logic BIST. The 10 G SerDes block is the basis for describing the technical topics. In addition, a new technique for chained alignment checks between adjacent channels helps achieve a channel-count-independent architecture for verification of multi-channel alignment between SerDes macros. Practical, published PLL BIST approaches cannot measure <10 ps RMS jitter or >1 GHz. You can start with a default and arbitrary configuration or connect to your board and read its current SerDes configuration. And for PRBS checker, a new method, called dynamic detecting is used to obtain the head symbol dynamically. ojtvqsxpewhcccfgeykxxxrxsqkmdiyjzxksfzmzndjfslmjvn